As Semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://opendemataccountonline63951.fare-blog.com/39838946/managing-clock-domain-crossing-challenges-in-modern-vlsi-designs